カールツァイス株式会社 News Releases

ZEISS Announces New FIB-SEM "Crossbeam 750" Achieving Highly Efficient TEM Lamella Preparation with Live SEM Imaging and High-Resolution Observation with Gemini 4 Electron Optics

ZEISS has announced the new FIB-SEM "Crossbeam 750," which enables highly efficient TEM lamella prep… · 2026-04-02

ZEISS Unveils New 'Crossbeam 750' FIB-SEM: High-Efficiency TEM Lamella Prep via Live SEM Imaging and High-Resolution Observation with Gemini 4 Optics

ZEISS has announced the launch of the Crossbeam 750, a new FIB-SEM designed for high-precision sampl… · 2026-04-02

ZEISS Announces New FIB-SEM "Crossbeam 750" Achieving Highly Efficient TEM Lamella Preparation with Live SEM Imaging and High-Resolution Observation with Gemini 4 Electron Optics

ZEISS has announced the new FIB-SEM "Crossbeam 750," which enables highly efficient TEM lamella prep… · 2026-04-02