The "NMIJ Results Presentation," which the National Metrology Institute of Japan (NMIJ) at the National Institute of Advanced Industrial Science and Technology (AIST) has held for over 20 years, was renamed the "NMIJ Open Day" starting this fiscal year and was held on January 29, 2026. This event aims to widely disseminate NMIJ's annual research achievements to society and share measurement technologies that will lead to future collaborations with industry and research institutions. In addition to traditional topic lectures, we held lab tours and satellite events to provide an opportunity for people to feel more familiar with metrology and measurement technology.

In this webinar, for those who were unable to attend in person, we will rebroadcast the third series of our program, which covers the latest measurement technologies NMIJ is working on to visualize the nanoscale world, divided into five topics.

We will introduce the latest trends in measurement technology required by industry, such as: thermal diffusivity measurement technology for thin films in both cross-plane and in-plane directions, which is essential for the thermal management of semiconductor devices; multi-angle SEM observation technology for accurately capturing sample information; on-the-fly particle size measurement technology required for quality and line management; operando multi-scale analysis technology using synchrotron radiation X-rays that supports high-speed and multi-modal applications; and vacancy measurement technology using positrons that can non-destructively detect atomic-level lattice defects.

This content provides hints for solving your company's challenges and creating new businesses for those who want to evaluate thin-film materials such as semiconductor devices, those who want to know the latest trends and precautions for SEM observation, those who want to visualize various particle measurements, those interested in evaluating battery materials or nanomaterials, and those who need void evaluation to improve material functionality or suppress degradation. We look forward to your participation.

<Recommended for:> - Those who want to evaluate the thermal properties of thin films or perform thermal design for semiconductor devices - Those who want to level up their knowledge of SEM acquisition conditions and interpretation methods - Those interested in practical particle measurement for real-time or production line applications - Those who want to perform material evaluation efficiently and effectively using synchrotron radiation X-rays - Those who want to evaluate sub-nano to nanoscale vacancies in materials

[Click here for registration and details] (https://www.aist-solutions.co.jp/events_webinars/webinars_2026041316.html?utm_source=prtimes&utm_medium=pressrelease&utm_campaign=webinars_2026041316)

Event Overview Date and Time: Monday, April 13, 2026, 10:00 AM – 11:30 AM Thursday, April 16, 2026, 3:00 PM – 4:30 PM *The content broadcast on both days is the same. *End times may vary slightly.

Participation Fee: Free Viewing Method: Online streaming. Viewing is possible via a web browser.

<Program> TOPIC 1: Development of cross-plane and in-plane thermal diffusivity measurement technology for thin films using the time-domain thermoreflectance method TOPIC 2: What can be seen with SEM/FIB-SEM: Multi-angle material evaluation and measurement TOPIC 3: Beyond visualization: Particle size refinement technology and on-the-fly measurement supporting quality and line management TOPIC 4: Development of X-ray multi-scale structural dynamics observation technology TOPIC 5: Application development of vacancy measurement using positrons

<Inquiries> AIST Solutions Event Management Team E-mail: webmktg-eve-ml@aist-solutions.co.jp

AIST Solutions plans to hold webinars on a variety of themes in the future. We look forward to your participation.

EVENTS/WEBINARS https://www.aist-solutions.co.jp/events_webinars/

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  • Source: PR TIMES
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