(AIST Group / Free Seminar) 'NMIJ Open Day' Industrial Applications Connected by Measurement Standards Series 3: Measuring and Visualizing the Nanoscale World - The Future of Material Evaluation and Industrial Application Pioneered by Measurement Technology [Broadcast April 13 & 16]

The "NMIJ Results Presentation," which has been held by the National Metrology Institute of Japan (NMIJ) at the National Institute of Advanced Industrial Science and Technology (AIST) for over 20 years, was renamed to the "NMIJ Open Day" and held on January 29, 2026. This event aims to widely disseminate NMIJ's research results over the past year to society and to share measurement technologies that will lead to future collaborations with industry and research institutions. In addition to traditional topic lectures, lab tours and satellite events were also held concurrently, providing an opportunity for people to feel closer to measurement standards and measurement technologies.

In this webinar, as Series 3, we will re-broadcast the latest measurement technologies being developed by NMIJ to visualize the nanoscale world, divided into 5 topics, targeting those who were unable to visit the venue on the day of the event.

We will introduce the latest trends in measurement technologies required by the industry, including out-of-plane and in-plane thermal diffusivity measurement technology for thin films essential for thermal management of semiconductor devices, multifaceted SEM observation technology to accurately capture sample information, on-the-fly particle size measurement technology required for quality control and line management, operando multi-scale analysis technology using high-speed and multimodal synchrotron X-rays, and positron vacancy measurement technology capable of non-destructively detecting lattice defects at the atomic level. This content will provide hints for solving your company's issues and creating new businesses for those who want to evaluate thin-film materials such as semiconductor devices, those who want to know the latest trends and precautions for SEM observation, those who want to visualize various particle measurements, those interested in evaluating battery materials and nanomaterials, and those who need void evaluation to improve material functionality and suppress degradation. We sincerely look forward to your participation.

<Recommended for> - Those who want to evaluate the thermophysical properties of thin films or design the thermal management of semiconductor devices - Those who want to improve their level regarding SEM acquisition conditions and interpretation methods - Those interested in practical particle measurement such as real-time and production line monitoring - Those who want to efficiently and effectively evaluate materials using synchrotron X-rays - Those who want to evaluate sub-nano to nano-scale vacancies in materials

[Click here for application and details]

Event Overview Dates & Times: Monday, April 13, 2026, 10:00 - 11:30 Thursday, April 16, 2026, 15:00 - 16:30 * The broadcast content will be the same on both days. * The end time may vary slightly. Participation Fee: Free Viewing Method: Online streaming. Viewing is possible from a browser.

<Program> TOPIC 1: Keywords: Thin film thermophysical properties, Out-of-plane/in-plane thermal diffusivity, SEM image interpretation, Low accelerating voltage observation, Particle size measurement, On-the-fly measurement, Operando observation, High-speed multimodal analysis, Positron lifetime measurement method, Positron microbeam