Takano to Exhibit at JPCA Show 2026, June 10–12
Takano Co., Ltd. will exhibit at JPCA Show 2026, held at Tokyo Big Sight from June 10 to 12, 2026. The company will showcase its inspection equipment, including the ALTAX series, designed for next-generation glass core substrates and co-packaged optics.
📋 Article Processing Timeline
- 📰 Published: May 21, 2026 at 22:50
- 🔍 Collected: May 21, 2026 at 14:31
- 🤖 AI Analyzed: May 21, 2026 at 14:35 (3 min after Collected)
Takano Co., Ltd. (Headquarters: Miyada Village, Nagano Prefecture; President and Representative Director: Masao Takano) will exhibit at JPCA Show 2026, to be held at Tokyo Big Sight from Wednesday, June 10, to Friday, June 12, 2026.
At this exhibition, the company will focus on its ALTAX (full-surface height inspection system) and showcase inspection equipment for packaging substrates, glass substrates, and wafer manufacturing processes.
In particular, the company will present its lineup of inspection systems that support glass core substrates and co-packaged optics, which are gaining attention as next-generation technologies, to meet a wide range of needs.
Event Overview: JPCA Show 2026
Dates: June 10 (Wed) – June 12 (Fri), 2026
Time: 10:00 – 17:00 (until 16:00 on the final day)
Venue: Tokyo Big Sight, East Exhibition Hall
Organizer: RX Japan Ltd.
Booth Number: 3F-42
Official Website: https://www.jpcashow.com/show2026/
Visitor Pre-registration: https://f-vr.jp/jpca/jpca2026/
Exhibited Products:
1. 2D/3D Appearance Inspection System ALTAX-FS (Panel Exhibition)
Capable of full-surface inspection for glass, wafers, and PKG substrates.
2. Full-Surface Height Inspection System for Wafers ALTAX-300EX (Panel Exhibition)
The latest advanced model supporting micro-bumps.
Other Products:
- Wafer Appearance Inspection System (Vi Series): High-precision inspection for wiring patterns, cracks, and foreign matter.
- Wafer Surface Inspection System (WM+ Series): The latest model supporting nano-level particle detection.
- Full-Surface Film Unevenness Inspection System (Thinspector): Enables full-surface inspection in a single scan.
- Film Appearance Inspection System (Hawkeyes Series)
At this exhibition, the company will focus on its ALTAX (full-surface height inspection system) and showcase inspection equipment for packaging substrates, glass substrates, and wafer manufacturing processes.
In particular, the company will present its lineup of inspection systems that support glass core substrates and co-packaged optics, which are gaining attention as next-generation technologies, to meet a wide range of needs.
Event Overview: JPCA Show 2026
Dates: June 10 (Wed) – June 12 (Fri), 2026
Time: 10:00 – 17:00 (until 16:00 on the final day)
Venue: Tokyo Big Sight, East Exhibition Hall
Organizer: RX Japan Ltd.
Booth Number: 3F-42
Official Website: https://www.jpcashow.com/show2026/
Visitor Pre-registration: https://f-vr.jp/jpca/jpca2026/
Exhibited Products:
1. 2D/3D Appearance Inspection System ALTAX-FS (Panel Exhibition)
Capable of full-surface inspection for glass, wafers, and PKG substrates.
2. Full-Surface Height Inspection System for Wafers ALTAX-300EX (Panel Exhibition)
The latest advanced model supporting micro-bumps.
Other Products:
- Wafer Appearance Inspection System (Vi Series): High-precision inspection for wiring patterns, cracks, and foreign matter.
- Wafer Surface Inspection System (WM+ Series): The latest model supporting nano-level particle detection.
- Full-Surface Film Unevenness Inspection System (Thinspector): Enables full-surface inspection in a single scan.
- Film Appearance Inspection System (Hawkeyes Series)
FAQ
What are the highlights of Takano's exhibition?
The exhibition features advanced inspection equipment for next-gen glass core substrates and co-packaged optics, centered on the ALTAX series.
Where is the venue?
Tokyo Big Sight, East Exhibition Hall.
Do I need to pay for admission?
Admission is free with prior registration on the visitor registration website.