Takano to Exhibit Ultra-High-Speed Film Inspection and AI-Powered Labor-Saving Solutions at '14th FilmTech Japan Osaka'

Takano Co., Ltd. (Headquarters: Miyada-mura, Kamiina-gun, Nagano Prefecture; Representative Director and President: Masao Takano) will exhibit at the '14th FilmTech Japan Osaka,' part of 'Highly-functional Material Week Osaka 2026,' to be held at Intex Osaka from May 13 (Wednesday) to 15 (Friday), 2026.

Against the backdrop of generative AI and 5G/6G, the high-functional film and semiconductor markets are expected to see further growth and higher quality demands. Takano aims to capture this demand and further strengthen sales in fields such as electronic materials, optical films, and energy.

At this exhibition, Takano will widely showcase its ultra-high-speed plain film inspection system (demonstration unit on display), real-time AI automatic defect classification system, and wafer surface inspection equipment. The booth is designed for visitors to 'see, touch, and experience' the features of Takano's inspection machines, so please stop by.

Booth Image

'14th FilmTech Japan Osaka' Event Overview

* Dates: May 13 (Wednesday) - 15 (Friday), 2026
* Hours: 10:00 - 17:00
* Venue: Intex Osaka
* Organizer: RX Japan Ltd.
* Booth Number: K13-52

Official HP: https://www.material-expo.jp/osaka/ja-jp/visit/film.html
Admission is free with pre-registration, so please apply via the visitor pre-registration site.

▽Click here for exhibition invitation ticket application (free) site
https://www.material-expo.jp/osaka/ja-jp/register.html

Featured Products

【Film Appearance Inspection Equipment Hawkeyes Series】

The Hawkeyes series achieves high-speed and high-precision inspection for the high-functional film market (optical, electronic materials, battery materials) by adopting proprietary cameras, image processing units, and inspection algorithms.

1. Ultra-High-Speed Plain Film Inspection System Hawkeyes one【Panel Display】

Ultra-High-Speed Plain Film Inspection System Hawkeyes one

By adopting proprietary high-performance cameras and newly developed image processing units, it achieves one of the industry's fastest inspection speeds (according to our research). It allows for high-resolution settings to detect minute defects in high-speed production lines. It can also parallelize multiple processes to detect various defects.
URL: https://www.takano-kensa.com/kensa/products/hawkeyesone/

2. Plain Film Inspection System Hawkeyes ELITE【Panel Display】

Plain Film Inspection System Hawkeyes ELITE

Equipped with proprietary high-performance cameras, it supports high-speed lines and offers excellent customization. It can detect various defects and handle products of various shapes.
URL: https://www.takano-kensa.com/kensa/products/hawkeyeselite/

3. Patterned Film Inspection System Hawkeyes PATTERN【Panel Display】

Patterned Film Inspection System Hawkeyes PATTERN

By selecting the appropriate optical system for the workpiece, it can inspect workpieces of various material shapes, such as complex wiring patterns, metal mesh patterns, and battery electrodes. It also selects appropriate image processing according to the pattern shape and target defects to detect defects.
URL: https://www.takano-kensa.com/kensa/products/hawkeyespattern/

4. Real-time AI Automatic Defect Classification System TAKANO AI【Panel Display】

Real-time AI Automatic Defect Classification System TAKANO AI

Bringing real-time AI-powered defect classification to your fingertips. Real-time defect classification is possible with simple operations, just by sorting images instead of traditional parameter input based on features.
URL: https://www.takano-kensa.com/kensa/column/ai-defect-classification-system/

5. Wafer Surface Inspection Equipment WM Series 【Panel Display】

WM Series: WM-7SR+WM Series: WM-10R+

Capable of highly sensitive particle detection on non-patterned wafers. Semiconductor lasers are used as light sources, reducing running costs. It can be used for wafer inspection, process control, research and development, etc.
URL: https://www.takano-kensa.com/kensa/products/backend-inspection/wm/

6. Wafer Appearance Inspection Equipment (Vi