Rohde & Schwarz to Host Power Electronics Online Conference 'From Design to Validation' in May
Rohde & Schwarz will hold an online conference on May 5-6, 2026, focusing on measurement and verification methods for power electronics, featuring experts from Hitachi Energy and Infineon.
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- 📰 Published: April 27, 2026 at 19:37
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Rohde & Schwarz is hosting the 'From Design to Validation' online conference on May 5 and 6, 2026. Experts from industry and academia will gather to discuss reliable measurement and verification methods for modern power electronics systems.
Caption: Rohde & Schwarz invites electronic developers and test engineers to the power electronics online conference 'From Design to Validation'.
The power electronics market is growing, driven by stricter efficiency goals, higher power density, and increased integration with large-scale power grids. As a result, engineers must address non-ideal component characteristics, high-speed transient stress in wide bandgap devices, and increasingly stringent EMC requirements. This conference addresses these challenges through measurement-centric solutions using the latest oscilloscopes, vector network analyzers, and precision power analyzers.
The program begins on May 5 with a keynote by Tobias Keller of Hitachi Energy titled 'Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades.' He will focus on the qualification of silicon and silicon carbide (SiC) devices for high-voltage grid applications, highlighting thermal cycling, short-circuit robustness, and long-term reliability data.
The second keynote on May 6 will be presented by Veit Hellwig of Infineon Technologies, examining the impact of gallium nitride (GaN) technology on high-voltage motor inverter topologies.
In addition to the keynotes, several technical sessions are scheduled. One session will cover passive component characterization, explaining techniques for extracting parasitic inductance and capacitance at frequencies above 100 MHz and their impact on converter stability. Another session will introduce automated dynamic characterization for SiC and GaN power devices, showing how to capture fast recovery behavior and reduce measurement uncertainty through the synchronization of double-pulse test equipment and high-speed digitizers.
Electromagnetic compatibility (EMC) will be addressed in two talks. The first introduces practical methods for identifying radiated noise sources using near-field probes and verifying the effectiveness of EMI filter designs. The second demonstrates a conducted emissions measurement workflow for small prototypes using a line impedance stabilization network (LISN) and the latest mixed-signal oscilloscopes, including filter design techniques using time-frequency analysis.
Another webinar will highlight the importance of high-precision efficiency measurements in data center and AI server power supplies. Using precision power analyzers capable of tracking distorted waveforms and steep load fluctuations, it will explain how to measure actual input and output power to meet 80 PLUS certification requirements.
The final session will explain the compliance of products connected to the low-voltage grid regarding harmonic currents and voltage flicker. It will cover limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11, showing how to use integrated compliance test software in conjunction with power analyzers to automatically perform pass/fail judgments from early prototypes to final certification.
Speakers include experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, Würth Elektronik, the University of Bremen, and the University of Zaragoza. These presentations blend academic insights with industrial practical experience, providing participants with both theoretical background and practical measurement techniques.
Participation is free of charge, but prior registration is required. Detailed program, speaker information, and registration are available at: http://www.rohde-schwarz.com/power-electronics-conference
www.rohde-schwarz.com
Contact:
Europe (Headquarters): Christian Mokry (Tel: +49 89 4129 13052, email: press@rohde-schwarz.com)
North America: Hannah Im (Tel: +1 301 957-8357, email: hannah.im@rsa.rohde-schwarz.com)
Asia Pacific: Cheyenne
Caption: Rohde & Schwarz invites electronic developers and test engineers to the power electronics online conference 'From Design to Validation'.
The power electronics market is growing, driven by stricter efficiency goals, higher power density, and increased integration with large-scale power grids. As a result, engineers must address non-ideal component characteristics, high-speed transient stress in wide bandgap devices, and increasingly stringent EMC requirements. This conference addresses these challenges through measurement-centric solutions using the latest oscilloscopes, vector network analyzers, and precision power analyzers.
The program begins on May 5 with a keynote by Tobias Keller of Hitachi Energy titled 'Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades.' He will focus on the qualification of silicon and silicon carbide (SiC) devices for high-voltage grid applications, highlighting thermal cycling, short-circuit robustness, and long-term reliability data.
The second keynote on May 6 will be presented by Veit Hellwig of Infineon Technologies, examining the impact of gallium nitride (GaN) technology on high-voltage motor inverter topologies.
In addition to the keynotes, several technical sessions are scheduled. One session will cover passive component characterization, explaining techniques for extracting parasitic inductance and capacitance at frequencies above 100 MHz and their impact on converter stability. Another session will introduce automated dynamic characterization for SiC and GaN power devices, showing how to capture fast recovery behavior and reduce measurement uncertainty through the synchronization of double-pulse test equipment and high-speed digitizers.
Electromagnetic compatibility (EMC) will be addressed in two talks. The first introduces practical methods for identifying radiated noise sources using near-field probes and verifying the effectiveness of EMI filter designs. The second demonstrates a conducted emissions measurement workflow for small prototypes using a line impedance stabilization network (LISN) and the latest mixed-signal oscilloscopes, including filter design techniques using time-frequency analysis.
Another webinar will highlight the importance of high-precision efficiency measurements in data center and AI server power supplies. Using precision power analyzers capable of tracking distorted waveforms and steep load fluctuations, it will explain how to measure actual input and output power to meet 80 PLUS certification requirements.
The final session will explain the compliance of products connected to the low-voltage grid regarding harmonic currents and voltage flicker. It will cover limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11, showing how to use integrated compliance test software in conjunction with power analyzers to automatically perform pass/fail judgments from early prototypes to final certification.
Speakers include experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, Würth Elektronik, the University of Bremen, and the University of Zaragoza. These presentations blend academic insights with industrial practical experience, providing participants with both theoretical background and practical measurement techniques.
Participation is free of charge, but prior registration is required. Detailed program, speaker information, and registration are available at: http://www.rohde-schwarz.com/power-electronics-conference
www.rohde-schwarz.com
Contact:
Europe (Headquarters): Christian Mokry (Tel: +49 89 4129 13052, email: press@rohde-schwarz.com)
North America: Hannah Im (Tel: +1 301 957-8357, email: hannah.im@rsa.rohde-schwarz.com)
Asia Pacific: Cheyenne