What inspection techniques can we learn in this seminar?

In addition to the basic principles of optical inspection devices, electron microscopes, and probe microscopes, you can learn about the latest analysis methods that combine light and electrons.

What is the background of the instructor?

Mr. Kiyoshi Fujiwara, who has experience in device development at Kioxia and is currently a specialist in condensed matter physics at the University of Tokyo.

When and where will the seminar be held?

The seminar will be held online via Zoom from 13:00 to 16:30 on May 22, 2026.

AndTech Announces Zoom Seminar: "Overview and Basic Principles of Inspection & Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons" Scheduled for Friday, May 22

Published Mar 30, 2026 11:28 PM ・ Updated Jun 28, 2026 6:12 PM ・ 5 min read ・ Source: PR TIMES

AndTech will host a Zoom seminar on May 22, 2026, aimed at engineers dealing with semiconductor processes, featuring a lecture by Hirokazu Fujiwara of the University of Tokyo on cutting-edge inspection technologies combining light and electrons.

AndTech Co., Ltd. (Headquarters: Kawasaki City, Kanagawa Prefecture; President: Masao Suyama; hereinafter "AndTech") announces the launch of the "Semiconductor Process Inspection and Analysis Technology" course as part of its Zoom lecture series supporting R&D development. This course addresses the growing need for problem-solving in semiconductor process inspection and analysis, featuring lectures by leading experts.

A speaker specializing in condensed matter physics with device development experience at a semiconductor manufacturer will introduce in detail the trends of advanced semiconductors, upcoming necessary inspection and analysis technologies, and particularly the 'new inspection methods utilizing light and electrons' currently under development!

This course is scheduled to be held on May 22, 2026.

Details: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405

Live Stream / WEB Seminar Overview ────────────────── Theme: Overview and Basic Principles of Inspection and Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons Date & Time: Friday, May 22, 2026, 13:00 - 16:30 Participation Fee: 45,100 JPY (tax included) * Materials to be distributed electronically URL: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405 WEB Delivery Format: Zoom (URL will be sent after registration)

Seminar Content Structure ──────────── - Program & Instructor - University of Tokyo, Graduate School of Frontier Sciences / (Former) Kioxia - Hirokazu Fujiwara

Knowledge to be Learned and Technical Issues to be Solved in this Seminar ─────────────────────── - Basic principles and characteristics of optical inspection equipment, electron microscopes, probe microscopes, etc. - Types and characteristics of inspection technologies required in semiconductor processes. - Trends in semiconductor devices and processes, latest trends in inspection and analysis technologies, and future prospects.

Attendance Format of this Seminar ───────────── This will be a live-streamed seminar using the web conferencing tool "Zoom." Details will be provided after registration.

About AndTech Co., Ltd. ────────────

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Source: PR TIMES
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AndTech Announces Zoom Seminar: "Overview and Basic Principles of Inspection & Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons" Scheduled for Friday, May 22

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