AndTech Announces Zoom Seminar: "Overview and Basic Principles of Inspection & Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons" Scheduled for Friday, May 22
AndTech will host a Zoom seminar on May 22, 2026, aimed at engineers dealing with semiconductor processes, featuring a lecture by Hirokazu Fujiwara of the University of Tokyo on cutting-edge inspection technologies combining light and electrons.
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- 📰 Published: March 30, 2026 at 23:28
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AndTech Co., Ltd. (Headquarters: Kawasaki City, Kanagawa Prefecture; President: Masao Suyama; hereinafter "AndTech") announces the launch of the "Semiconductor Process Inspection and Analysis Technology" course as part of its Zoom lecture series supporting R&D development. This course addresses the growing need for problem-solving in semiconductor process inspection and analysis, featuring lectures by leading experts.
A speaker specializing in condensed matter physics with device development experience at a semiconductor manufacturer will introduce in detail the trends of advanced semiconductors, upcoming necessary inspection and analysis technologies, and particularly the 'new inspection methods utilizing light and electrons' currently under development!
This course is scheduled to be held on May 22, 2026.
Details: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405
Live Stream / WEB Seminar Overview
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Theme: Overview and Basic Principles of Inspection and Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons
Date & Time: Friday, May 22, 2026, 13:00 - 16:30
Participation Fee: 45,100 JPY (tax included) * Materials to be distributed electronically
URL: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405
WEB Delivery Format: Zoom (URL will be sent after registration)
Seminar Content Structure
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- Program & Instructor -
University of Tokyo, Graduate School of Frontier Sciences / (Former) Kioxia - Hirokazu Fujiwara
Knowledge to be Learned and Technical Issues to be Solved in this Seminar
───────────────────────
- Basic principles and characteristics of optical inspection equipment, electron microscopes, probe microscopes, etc.
- Types and characteristics of inspection technologies required in semiconductor processes.
- Trends in semiconductor devices and processes, latest trends in inspection and analysis technologies, and future prospects.
Attendance Format of this Seminar
─────────────
This will be a live-streamed seminar using the web conferencing tool "Zoom."
Details will be provided after registration.
About AndTech Co., Ltd.
────────────
A speaker specializing in condensed matter physics with device development experience at a semiconductor manufacturer will introduce in detail the trends of advanced semiconductors, upcoming necessary inspection and analysis technologies, and particularly the 'new inspection methods utilizing light and electrons' currently under development!
This course is scheduled to be held on May 22, 2026.
Details: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405
Live Stream / WEB Seminar Overview
──────────────────
Theme: Overview and Basic Principles of Inspection and Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons
Date & Time: Friday, May 22, 2026, 13:00 - 16:30
Participation Fee: 45,100 JPY (tax included) * Materials to be distributed electronically
URL: https://andtech.co.jp/seminars/1f101a25-cbc4-647a-80ad-064fb9a95405
WEB Delivery Format: Zoom (URL will be sent after registration)
Seminar Content Structure
────────────
- Program & Instructor -
University of Tokyo, Graduate School of Frontier Sciences / (Former) Kioxia - Hirokazu Fujiwara
Knowledge to be Learned and Technical Issues to be Solved in this Seminar
───────────────────────
- Basic principles and characteristics of optical inspection equipment, electron microscopes, probe microscopes, etc.
- Types and characteristics of inspection technologies required in semiconductor processes.
- Trends in semiconductor devices and processes, latest trends in inspection and analysis technologies, and future prospects.
Attendance Format of this Seminar
─────────────
This will be a live-streamed seminar using the web conferencing tool "Zoom."
Details will be provided after registration.
About AndTech Co., Ltd.
────────────