The "NMIJ Achievements Presentation," held by the National Metrology Institute of Japan (NMIJ) of the National Institute of Advanced Industrial Science and Technology (AIST) for over 20 years, was renamed "National Metrology Institute of Japan Open Day" this fiscal year and held on January 29, 2026. This event aims to widely disseminate NMIJ's research achievements over the past year to society and to share measurement technologies that can lead to future collaborations with industry and research institutions. In addition to traditional topic lectures, lab tours and satellite events were also held concurrently, providing an opportunity to experience metrology standards and measurement technologies more closely. This webinar is a rebroadcast for those who could not attend the event in person, delivering the latest measurement technologies for visualizing the nanoscale world, which NMIJ is working on, divided into five topics as Series 3. We will introduce the latest trends in measurement technologies required by industry, including techniques for measuring the in-plane and through-plane thermal diffusivity of thin films essential for thermal management of semiconductor devices, multi-angle SEM observation techniques for accurately capturing sample information, on-the-fly measurement techniques for particle size required for quality and line management, high-speed and multi-modal synchrotron X-ray operando and multi-scale analysis techniques, and positron annihilation lifetime spectroscopy for detecting vacancies from atomic-level lattice defects non-destructively. This content will provide hints for solving your company's challenges and creating new business opportunities for those who want to evaluate thin-film materials such as semiconductor devices, want to know the latest trends and precautions for SEM observation, want to visualize various particle measurements, are interested in evaluating battery materials and nanomaterials, and need void evaluation to improve material functionality or suppress degradation. We sincerely look forward to your participation.

＜Recommended for＞ ・Those who want to evaluate the thermal properties of thin films and perform thermal design for semiconductor devices. ・Those who want to improve their skills in SEM acquisition conditions and interpretation methods. ・Those interested in practical particle measurement, such as real-time and production lines. ・Those who want to perform efficient and effective material evaluation using synchrotron X-rays. ・Those who want to evaluate sub-nano to nanoscale voids in materials.

Click here for application and details Event Overview Date and Time: April 13, 2026 (Monday) 10:00 AM - 11:30 AM April 16, 2026 (Thursday) 3:00 PM - 4:30 PM * The content broadcast on both days will be the same. * The end time may vary slightly. Participation Fee: Free How to Watch: Online broadcast. Viewing is possible via browser.

＜Program＞ TOPIC 1:

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