(AIST Group / Free Seminar) Capturing the Nano World on 'Video' - The Potential of High-Speed AFM [April 24, Osaka Umekita / Hybrid Event]
The AIST Group will hold a free hybrid seminar in Osaka on April 24, 2026, exploring the potential of High-Speed AFM, an innovative technology for visualizing nanoscale molecular dynamics in liquids in real-time, focusing on its applications to non-biological materials.
📋 Article Processing Timeline
- 📰 Published: April 2, 2026 at 20:00
- 🔍 Collected: April 2, 2026 at 14:00
- 🤖 AI Analyzed: April 21, 2026 at 06:25 (448h 24m after Collected)
High-Speed Atomic Force Microscopy (HS-AFM) is an innovative measurement technology that can visualize the nanoscale structures and dynamics of molecules in a liquid environment in real-time.
In this seminar, Dr. Nishiguchi, a researcher at AIST, will introduce the latest research results using HS-AFM, including the visualization of molecular structural changes in liquid, analysis of intermolecular interactions, and tracking of reactions and behaviors that occur when solutions are added.
He will explain not only the observation of molecules in the life sciences field, such as antibodies, membrane proteins, and nucleic acids, but also the potential applications to non-biological materials such as polymer materials, battery materials, and other functional materials.
Furthermore, from an industrial utilization perspective, we will discuss how this can be deployed into joint research and technical consulting.
Areas where applications are not yet established present opportunities for creating new value!
Please use this seminar as the first step to connect your company's research challenges with the potential of HS-AFM.
(Leaflet) Capturing the Nano World on Video: The Potential of High-Speed AFM [PDF Format / 8.2MB]
- Those interested in visualizing molecular dynamics and interaction processes in the biopharmaceutical field.
- Those facing challenges in the nanoscale analysis of polymer materials, adhesives, and interfacial behaviors.
- Those considering methods to evaluate liquid interfaces and state changes in material development.
- Analysis and inspection equipment manufacturers exploring new device concepts and analysis methods.
- Researchers facing phenomena that cannot be captured by TEM / SEM / fluorescence measurement.
- Technical planning and R&D personnel responsible for creating new themes and exploring technologies.
Click here for application and details
Event Overview
Date & Time:
Friday, April 24, 2026, 15:30-17:30
Format:
On-site venue or Online
Capacity:
On-site participation: 50 people
Participation Fee: Free